G01R 33/1253
Measuring galvano-magnetic properties
Official title: {Measuring galvano-magnetic properties}
G01R33/1253 (Measuring galvano-magnetic properties) appears on 33 US grants and 31 published applications in this corpus.
Search patents in G01R- Granted patents
- 33
- Published applications
- 31
- Assignees
- 27
- Inventors
- 62
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 2 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 1 | 3 |
| 2016 | 1 | 1 |
| 2017 | 2 | 3 |
| 2018 | 1 | 2 |
| 2019 | 4 | 1 |
| 2020 | 2 | 5 |
| 2021 | 4 | 3 |
| 2022 | 4 | 4 |
| 2023 | 2 | 0 |
| 2024 | 1 | 2 |
| 2025 | 2 | 1 |
| 2026 | 1 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method, computer program, and system for determining respective transport properties of majority as well as minority charge carriers in a sample12 May 2026US 12,625,202 B2Helmholtz-Zentrum Berlin FüR Materialien Und Energie GmbH
- Magnetoresistance effect element and Heusler alloy4 Feb 2025US 12,217,775 B2TDK Corporation
- Control device, multi-projection system and control method of control device28 Jan 2025US 12,212,896 B2Seiko Epson Corporation
- Measurement method for B-H curve of magnetic material based on magnetic-inductance23 Apr 2024US 11,965,942 B2Southeast University
- Magnetoresistance effect element and Heusler alloy26 Sep 2023US 11,769,523 B2TDK Corporation
- Device and method for detecting surface weak magnetic fields based on giant magneto-impedance effect16 Jul 2026US 2026/0202492 A1Beijing Physcience Opto-electronics Co., Ltd.
- Near eye display metrology instrument12 Feb 2026US 2026/0044012 A1Novanta Corporation
- Magnetoresistance effect element and heusler alloy26 Jun 2025US 2025/0210060 A1TDK Corporation
- Method, computer program, and system for determining respective transport properties of majority as well as minority charge carriers in a sample21 Nov 2024US 2024/0385262 A1Helmholtz-Zentrum Berlin FüR Materialien Und Energie GmbH
- Magnetoresistance effect element and heusler alloy22 Feb 2024US 2024/0062777 A1TDK Corporation
Most cited
By later US patents
- Method and apparatus for testing the resistive properties of magneto resistive materials using a time variable magnetic field25US 5,696,445 APhase Metrics · 1997
- Noncontacting measurement of hall effect in a wafer20US 4,190,799 ABell Telephone Laboratories, Incorporated · 1980
- Apparatus for testing Hall effect device20US 5,032,791 AA&E Manufacturing Company · 1991
- Detection of polarized spin transport in semiconductors11US 6,403,999 B1Spinix Corporation · 2002
- Contactless hall coefficient measurement apparatus and method for piezoelectric material7US 4,785,232 AThe United States of America as represented by the Secretary of the Army · 1988