G01R 27/2682
Using optical methods or electron beams
Official title: {using optical methods or electron beams}
G01R27/2682 (Using optical methods or electron beams) appears on 7 US grants and 12 published applications in this corpus.
Search patents in G01R- Granted patents
- 7
- Published applications
- 12
- Assignees
- 11
- Inventors
- 32
- Latest grant
- 9 Dec 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 1 |
| 2019 | 2 | 1 |
| 2020 | 1 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 2 |
| 2023 | 1 | 2 |
| 2024 | 0 | 0 |
| 2025 | 1 | 2 |
| 2026 | 0 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Delay time measurement method and system9 Dec 2025US 12,494,341 B2ASML Netherlands B. V.
- Measuring device for determining a dielectric constant comprising an electrically conductive arrangement electrically contacts two waveguides with one another3 Oct 2023US 11,774,477 B2Endress + Hauser GmbH + Co. KG
- Measuring device for liquid crystal dielectric constant, measuring apparatus, measuring method7 Sep 2021US 11,112,440 B2Boe Technology Group Co., Ltd.
- Well monitoring with optical electromagnetic sensing system7 Jul 2020US 10,704,377 B2Halliburton Energy Services.Inc.
- System and method for non-contact measurement of optoelectronic properties of thin film19 Nov 2019US 10,481,188 B2Korea Institute of Science and Technology
- Machine learning guided electrochemical impedance spectroscopy for calibration-free pharmaceutical moisture content monitoring5 Mar 2026US 2026/0063608 A1Purdue Research Foundation
- Method for testing a substrate, and apparatus for testing a substrate25 Sep 2025US 2025/0298078 A1
- Methods and apparatuses for identifying defective electrical connections of a substrate3 Jul 2025US 2025/0216479 A1
- Active optical elements based on charge density wave and broken symmetry23 Nov 2023US 2023/0375605 A1Uchicago Argonne, LLC
- Delay time measurement method and system21 Sep 2023US 2023/0298852 A1ASML Netherlands B. V.
Most cited
By later US patents