G01R 13/208
Arrangements for measuring with c.r. oscilloscopes
Official title: {Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope}
G01R13/208 (Arrangements for measuring with c.r. oscilloscopes) appears on 19 US grants and 6 published applications in this corpus.
Search patents in G01R- Granted patents
- 19
- Published applications
- 6
- Assignees
- 16
- Inventors
- 40
- Latest grant
- 10 Sep 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 2 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 0 | 1 |
| 2020 | 3 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
| 2024 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Swept parameter oscilloscope10 Sep 2024US 12,085,590 B2Tektronix, Inc.
- Measuring device for measuring signals and data handling method2 Nov 2021US 11,163,455 B2Rohde & Schwarz GmbH & Co.KG
- Surface-mountable apparatus for coupling a test and measurement instrument to a device under test24 Nov 2020US 10,845,384 B2Tektronix, Inc.
- Variable resolution oscilloscope28 Jul 2020US 10,725,070 B2Teledyne LeCroy, Inc.
- Variable resolution oscilloscope14 Jan 2020US 10,534,019 B2Teledyne LeCroy, Inc.
- Swept parameter oscilloscope19 Jan 2023US 2023/0019734 A1Tektronix, Inc.
- Variable Resolution Oscilloscope19 Mar 2020US 2020/0088766 A1Teledyne LeCroy, Inc.
- Surface-mountable apparatus for coupling a test and measurement instrument to a device under test21 Nov 2019US 2019/0353682 A1Tektronix, Inc.
- Measuring device for measuring signals and data handling method3 May 2018US 2018/0121113 A1Rohde & Schwarz GmbH & Co.KG
- Variable resolution oscilloscope1 Mar 2018US 2018/0059143 A1Teledyne LeCroy, Inc.
Most cited
By later US patents
- Waveform storage system29US 4,271,486 ATektronix, Inc. · 1981
- General purpose oscilloscope having digital television signal display capability18US 6,518,744 B1Tektronix, Inc. · 2003
- Vector analyzer with display markers and linear transform capability15US 4,818,931 AHewlett-Packard Company · 1989
- Raster scan waveform display rasterizer with pixel intensity gradation10US 5,440,676 ATektronix, Inc. · 1995
- Automatic amplitude control circuit for a vector scope10US 5,589,877 ALeader Electronics Corporation · 1996