Surface-mountable apparatus for coupling a test and measurement instrument to a device under test
AssigneeTektronix, Inc.
InventorJulie A. Campbell
Life of this patent
Estimating the term…
Abstract
An apparatus for coupling a test and measurement instrument to a device under test comprises a clip structured to be attached between two conductive portions of the device under test, and an insert structured to be removably installed in the clip. The insert is configured to provide a current path between the two conductive portions of the device under test. In embodiments, the insert comprises a resistive element, which may be a round rod resistor. Additional embodiments may be described and/or claimed herein.
Claims19
An apparatus for coupling a test and measurement instrument to a device under test, comprising:
- a clip having a conductive first end, a conductive second end, and a non-conductive member connecting the first and second ends, the clip structured to be attached between two conductive portions of the device under test such that the clip bridges a non-conductive gap between the two conductive portions;
- a first insert structured to be removably installed in the clip, and to provide a substantially unimpeded current path between the two conductive portions of the device under test;
- and
- a second insert structured to be removably installed in the clip, and to provide a pair of signal measurement points for coupling to the test and measurement instrument, wherein the second insert comprises a portion of a probe tip.
A system, comprising:
- a clip having a conductive first end, a conductive second end, and a non-conductive member connecting the first and second ends, the clip structured to be attached between two conductive portions of a device under test such that the clip bridges a non-conductive gap between the two conductive portions;
- a first insert structured to be removably installed in the clip, and to provide a substantially unimpeded current path between the two conductive portions of the device under test;
- an oscilloscope;
- and
- a probe, wherein a probe tip of the probe includes a second insert structured to be removably installed in the clip, the probe tip configured to output a voltage signal indicative of a current through the second insert, the probe coupling the output of the probe tip to an input of the oscilloscope.
A method for configuring an operational mode of a device under test, DUT, the method comprising:
- attaching a clip between two conductive portions of the DUT such that the clip bridges a non-conductive gap between the two conductive portions, the clip having a conductive first end, a conductive second end, and a non-conductive member connecting the first and second ends;
- for a normal operational mode of the DUT, installing a first insert into the clip, the first insert structured to be removably installed in the clip, and to provide a substantially unimpeded current path between the two conductive portions of the DUT;
- and
- for a measurement operational mode of the DUT, installing a second insert into the clip, the second insert structured to be removably installed in the clip, and to provide a pair of signal measurement points for coupling to a test and measurement instrument.
Dependencies are inferred from the claim text.