G01N 2223/427
Stepped imaging
Official title: stepped imaging (selected area of sample is changed)
G01N2223/427 (Stepped imaging) appears on 28 US grants and 40 published applications in this corpus.
Search patents in G01N- Granted patents
- 28
- Published applications
- 40
- Assignees
- 30
- Inventors
- 109
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 2 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
| 2010 | 1 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 4 |
| 2016 | 2 | 3 |
| 2017 | 2 | 0 |
| 2018 | 2 | 1 |
| 2019 | 1 | 5 |
| 2020 | 3 | 6 |
| 2021 | 7 | 4 |
| 2022 | 3 | 1 |
| 2023 | 2 | 3 |
| 2024 | 1 | 4 |
| 2025 | 1 | 5 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Detector and method for obtaining Kikuchi images14 Apr 2026US 12,603,246 B2Bruker Nano, Inc.
- Procedure for generating fluoroscopic images for the reconstruction of a volume in a flat object using an X-ray system4 Nov 2025US 12,461,045 B2Comet Yxlon GmbH
- Charged particle beam apparatus17 Dec 2024US 12,169,182 B2Hitachi High-Tech Corporation
- X-ray imaging apparatus21 Nov 2023US 11,821,851 B2Shimadzu Corporation
- Charged particle beam apparatus5 Sep 2023US 11,747,292 B2Hitachi High-Tech Corporation
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Apparatus and method for inspecting an engine component16 Oct 2025US 2025/0321159 A1
- Method for the generation of a digital identity16 Oct 2025US 2025/0321187 A1
- Imaging systems with small x-ray sources17 Jul 2025US 2025/0231131 A1Shenzhen Xpectvision Technology Co., Ltd.
- Adaptive slice depth in slice & view workflow3 Apr 2025US 2025/0112024 A1FEI Company
Most cited
By later US patents
- Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques53US 9,357,975 B2Carestream Health, Inc. · 2016
- Inspection system and method48US 7,483,511 B2GE Homeland Protection, Inc. · 2009
- Thermal wave microscopy using areal infrared detection22US 4,578,584 AInternational Business Machines Corporation · 1986
- X ray apparatus and method of operating the same13US 10,098,609 B2Samsung Electronics Co., Ltd. · 2018
- High-resolution computed tomography7US 9,459,217 B2Illinois Tool Works Inc. · 2016