G01N 2223/3103
Cooling, cryostats
Official title: cooling, cryostats
G01N2223/3103 (Cooling, cryostats) appears on 35 US grants and 40 published applications in this corpus.
Search patents in G01N- Granted patents
- 35
- Published applications
- 40
- Assignees
- 36
- Inventors
- 119
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 3 |
| 2017 | 1 | 4 |
| 2018 | 7 | 2 |
| 2019 | 1 | 3 |
| 2020 | 5 | 7 |
| 2021 | 1 | 1 |
| 2022 | 4 | 1 |
| 2023 | 4 | 5 |
| 2024 | 1 | 3 |
| 2025 | 2 | 5 |
| 2026 | 4 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for scanning a component22 Sep 2026US 12,742,710 B2ROLLS-ROYCE plc
- Scanning parts at target temperatures22 Sep 2026US 12,742,741 B2West Pharmaceutical Services, Inc.
- X-ray inspection apparatus15 Sep 2026US 12,736,688 B2Ishida Co., Ltd.
- Integrated backscatter X-ray assemblies for detecting backscatter X-rays reflected by target area of article under test and associated methods6 Jan 2026US 12,517,070 B2The Boeing Company
- X-ray inspection device11 Nov 2025US 12,467,885 B2Ishida Co., Ltd.
- Method for determining a deformation field of at least one layer of paint applied to a support during crosslinking of the layer or the layers of paint5 Feb 2026US 2026/0036531 A1Airbus SAS
- Method of time-resolved charged particle microscopy15 Jan 2026US 2026/0018373 A1FEI Company
- Temperature adjusting device, method, and program of radiography apparatus, and radiography apparatus1 Jan 2026US 2026/0002889 A1FUJIFILM Corporation
- Open-air, variable-temperature x-ray diffractometer11 Dec 2025US 2025/0377319 A1King Fahd University of Petroleum and Minerals
- Radiography apparatus, temperature control method of radiography apparatus, and temperature control program27 Nov 2025US 2025/0362250 A1FUJIFILM Corporation
Most cited
By later US patents
- Analysis of fluids13US 4,795,903 AUnited Kingdom Atomic Energy Authority · 1989
- Imaging inspection apparatus with improved cooling9US 7,354,197 B2Endicott Interconnect Technologies, Inc. · 2008
- X-ray chemical analyzer for field applications8US 4,063,089 AThe United States of America as represented by the United States Energy Research and Development Administration · 1977
- Method of making an imaging inspection apparatus with improved cooling8US 7,490,984 B2Endicott Interconnect Technologies, Inc. · 2009
- Low-temperature goniometer for X-ray and neutron diffractometry7US 4,644,761 AKernforschungsanlage Julich Gesellschaft mit beschrankter Haftung · 1987