G01N 2201/1266
Interface card
G01N2201/1266 (Interface card) appears on 4 US grants and 5 published applications in this corpus.
Search patents in G01N- Granted patents
- 4
- Published applications
- 5
- Assignees
- 4
- Inventors
- 30
- Latest grant
- 23 Dec 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 2 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 3 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Processing device and inspection apparatus for optical inspection and corresponding methods23 Dec 2025US 12,504,381 B2Leica Microsystems (Suzhou) Technology Co., Ltd.
- Mobile chemical analysis13 Jul 2021US 11,060,968 B2International Business Machines Corporation
- Fabric support for quality of service11 May 2021US 11,005,968 B2Intel Corporation
- Modular scatterometer with interchangeable scanning heads23 Mar 1993US 5,196,906 ATMA Technologies, Inc.
- Processing device and inspection apparatus for optical inspection and corresponding methods11 Jul 2024US 2024/0230550 A9Leica Microsystems (Suzhou) Technology Co., Ltd.
- Processing device and inspection apparatus for optical inspection and corresponding methods25 Apr 2024US 2024/0133823 A1Leica Microsystems (Suzhou) Technology Co., Ltd.
- Configurable non-destructive testing device21 Mar 2024US 2024/0094878 A1
- Mobile chemical analysis3 Oct 2019US 2019/0302008 A1International Business Machines Corporation
- Fabric Support for Quality of Service23 Aug 2018US 2018/0241842 A1Intel Corporation
Most cited
By later US patents