G01N 2201/1045
Spiral scan
G01N2201/1045 (Spiral scan) appears on 37 US grants and 26 published applications in this corpus.
Search patents in G01N- Granted patents
- 37
- Published applications
- 26
- Assignees
- 28
- Inventors
- 107
- Latest grant
- 7 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 5 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 2 |
| 2005 | 0 | 1 |
| 2006 | 2 | 3 |
| 2007 | 3 | 0 |
| 2008 | 0 | 1 |
| 2009 | 1 | 2 |
| 2010 | 0 | 1 |
| 2011 | 1 | 0 |
| 2012 | 2 | 0 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 0 | 2 |
| 2016 | 1 | 2 |
| 2017 | 1 | 2 |
| 2018 | 1 | 1 |
| 2019 | 1 | 1 |
| 2020 | 2 | 3 |
| 2021 | 2 | 0 |
| 2022 | 2 | 1 |
| 2023 | 1 | 1 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Multi-spectral microparticle-fluorescence photon cytometry7 Apr 2026US 12,596,124 B2Miftek Corporation
- Defect inspection apparatus and defect inspection method22 Jul 2025US 12,366,538 B2Hitachi High-Tech Corporation
- Multi-spectral microparticle-fluorescence photon cytometry5 Dec 2023US 11,835,525 B2Miftek Corporation
- Method of observing objects using a spinning localized observation4 Oct 2022US 11,460,527 B1
- Recording dynamics of cellular processes22 Feb 2022US 11,255,837 B2University of Vienna
- Multi-spectral microparticle-fluorescence photon cytometry18 Apr 2024US 2024/0125790 A1Miftek Corporation
- Defect inspection apparatus and defect inspection method8 Jun 2023US 2023/0175978 A1Hitachi High-Tech Corporation
- Sequencing systems and methods utilizing curved imaging paths on rotating substrates22 Dec 2022US 2022/0403466 A1MGI Tech Co., Ltd.
- Multi-spectral microparticle-fluorescence photon cytometry29 Oct 2020US 2020/0340999 A1Captl LLC
- Raman spectrum detection apparatus and method8 Oct 2020US 2020/0319112 A1Nuctech Company Limited
Most cited
By later US patents
- Apparatus for surface inspections58US 5,377,002 ATet Techno Trust Investment Settlement · 1994
- Apparatus and method for surface inspection by specular interferometric and diffuse light detection58US 5,875,029 APhase Metrics · 1999
- Surface defect inspecting apparatus52US 4,626,101 AKabushiki Kaisha Toshiba · 1986
- Apparatus for surface inspection39US 5,377,001 ATet Techno Trust Investment Settlement · 1994
- System for checking defects on a flat surface of an object32US 4,508,450 AOlympus Optical Co., Ltd. · 1985