G01N 2021/438
With investigation of wavelength
Official title: {with investigation of wavelength}
G01N2021/438 (With investigation of wavelength) appears on 6 US grants and 5 published applications in this corpus.
Search patents in G01N- Granted patents
- 6
- Published applications
- 5
- Assignees
- 14
- Inventors
- 16
- Latest grant
- 28 Jan 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 1 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 2 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
| 2025 | 1 | 0 |
By publication year.
Recent patents
- Method and device for analysing a sample using a resonant support, illuminated by infrared radiation28 Jan 2025US 12,209,956 B2Centre National De La Recherche Scientifique
- Method and device for analysing a sample, implementing a resonant support27 Aug 2024US 12,072,282 B2Avalun
- Optical refractive index measuring system based on speckle correlation2 Aug 2016US 9,404,856 B2Macau University of Science and Technology
- Optically amplified critical wavelength refractometer17 Nov 2009US 7,619,725 B1SeaLite Engineering, Inc.
- Refractometer5 Apr 2005US 6,876,444 B2Franz Schmidt & Haensch GmbH & Co.
- Method and device for analysing a sample, implementing a resonant support6 Oct 2022US 2022/0317028 A1Avalun
- Method and device for analysing a sample using a resonant support, illuminated by infrared radiation6 Oct 2022US 2022/0317031 A1Centre National De La Recherche Scientifique
- Optical Refractive Index Measuring System Based on Speckle Correlation4 Dec 2014US 2014/0354979 A1Macau University of Science and Technology
- Optically amplified critical wavelength refractometer12 Nov 2009US 2009/0279074 A1SeaLite Engineering, Inc.
- Refractometer21 Aug 2003US 2003/0156278 A1Franz Schmidt & Haensch GmbH & Co.
Most cited
By later US patents