G01L 5/0047
Measuring forces due to residual stresses
Official title: {measuring forces due to residual stresses}
G01L5/0047 (Measuring forces due to residual stresses) appears on 197 US grants and 184 published applications in this corpus.
Search patents in G01L- Granted patents
- 197
- Published applications
- 184
- Assignees
- 178
- Inventors
- 513
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 4 | 0 |
| 1998 | 3 | 0 |
| 1999 | 2 | 0 |
| 2000 | 4 | 0 |
| 2001 | 1 | 2 |
| 2002 | 1 | 7 |
| 2003 | 11 | 4 |
| 2004 | 4 | 5 |
| 2005 | 3 | 7 |
| 2006 | 9 | 13 |
| 2007 | 4 | 11 |
| 2008 | 12 | 13 |
| 2009 | 14 | 6 |
| 2010 | 7 | 4 |
| 2011 | 8 | 7 |
| 2012 | 6 | 8 |
| 2013 | 5 | 3 |
| 2014 | 6 | 3 |
| 2015 | 2 | 8 |
| 2016 | 0 | 6 |
| 2017 | 8 | 6 |
| 2018 | 10 | 11 |
| 2019 | 8 | 12 |
| 2020 | 7 | 10 |
| 2021 | 10 | 11 |
| 2022 | 10 | 10 |
| 2023 | 6 | 6 |
| 2024 | 12 | 6 |
| 2025 | 5 | 3 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Systems and methods for analysis of material properties of components and structures using machining processes to enable stress relief in the material under test23 Jun 2026US 12,663,347 B2
- Systems and methods for rapid force-based measurements of residual stress12 May 2026US 12,625,021 B1National Technology & Engineering Solutions of Sandia, LLC
- Method for determining a deformation of an area of a part obtained by additive manufacturing2 Dec 2025US 12,487,071 B2Centre National De La Recherche Scientifique
- Measurement system and measurement method7 Oct 2025US 12,436,118 B2Kobe Steel, Ltd.
- Residual stress estimation apparatus and method20 May 2025US 12,306,097 B2Hyundai Motor Company
- Method for analyzing post-assembly residual stresses in microwave assembly4 Jun 2026US 2026/0153393 A138th Research Institute, China Electronics Technology Group Corporation
- Calculation method, calculation device, and calculation program of residual stress distribution19 Mar 2026US 2026/0079059 A1Jfe Steel Corporation
- Apparatus and methods utilizing stress sensing structures to determine mechanical stress distribution in a semiconductor material27 Nov 2025US 2025/0362190 A1STMicroelectronics International N. V.
- Method for Measuring Residual Stress in Thin Plate10 Jul 2025US 2025/0224290 A1Chinalco Advanced Manufacturing Co., Ltd.
- Method of Calculating Wellhead System Load Capacity13 Feb 2025US 2025/0052144 A1Plexus Holdings, PLC.
Most cited
By later US patents
- Photonic mems and structures872US 6,650,455 B2Iridigm Display Corporation · 2003
- Photonic MEMS and structures616US 7,123,216 B1Idc, LLC · 2006
- Photonic MEMS and structures207US 7,110,158 B2Idc, LLC · 2006
- Strengthening, crack arrest and multiple cracking in brittle materials using residual stresses118US 6,516,634 B1The Penn State Research Foundation · 2003
- Photonic MEMS and structures113US 7,236,284 B2Idc, LLC · 2007