G01J 2009/0253
Of wavelength
Official title: {of wavelength}
G01J2009/0253 (Of wavelength) appears on 13 US grants and 11 published applications in this corpus.
Search patents in G01J- Granted patents
- 13
- Published applications
- 11
- Assignees
- 13
- Inventors
- 23
- Latest grant
- 27 May 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 2 |
| 2019 | 2 | 1 |
| 2020 | 2 | 1 |
| 2021 | 2 | 1 |
| 2022 | 0 | 2 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
| 2025 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Laser interferometer27 May 2025US 12,313,469 B2Seiko Epson Corporation
- Interferometer with at least one dispersive element21 May 2024US 11,988,562 B2Systems & Technology Research, LLC
- Coherent light detection system and method29 Jun 2021US 11,047,742 B2The Boeing Company
- Method and device for analysing an electromagnetic wave in high definition8 Jun 2021US 11,029,214 B2Phasics
- Wavelength shifting in spectrally-controlled interferometry27 Oct 2020US 10,816,408 B1Apre Instruments, LLC
- System and method for measuring instantaneous frequency of a light signal13 Nov 2025US 2025/0347565 A1Stichting IMEC Nederland
- Interferometer with at least one dispersive element13 Oct 2022US 2022/0326086 A1Systems & Technology Research, LLC
- Laser interferometer1 Sep 2022US 2022/0276098 A1Seiko Epson Corporation
- Coherent light detection system and method20 May 2021US 2021/0148764 A1The Boeing Company
- System for Measuring Optical Phase of a Specimen Using Defocused Images Thereof6 Aug 2020US 2020/0249095 A1Wavefront Analysis, Inc.
Most cited
By later US patents
- Method and apparatus for two-wavelength interferometry with optical heterodyne processes and use for position or range finding34US 4,907,886 AWild Heerburgg, AG · 1990
- Method and apparatus for high resolution monitoring of optical signals17US 6,687,009 B2Nortel Networks Limited · 2004
- Method and apparatus for high resolution monitoring of optical signals10US 6,493,088 B1Nortel Networks Limited · 2002
- Digital pulse counting method for measuring the optical path difference of an imbalanced interferometer5US 5,066,128 ACanadian Marconi Company · 1991
- Spatial-domain low-coherence quantitative phase microscopy3US 10,156,479 B2University of Pittsburgh—Of the Commonwealth System of Higher Education · 2018