G01J 2009/0207
Double frequency
Official title: {Double frequency, e.g. Zeeman}
G01J2009/0207 (Double frequency) appears on 8 US grants and 1 published applications in this corpus.
Search patents in G01J- Granted patents
- 8
- Published applications
- 1
- Assignees
- 6
- Inventors
- 10
- Latest grant
- 14 Sep 2010
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 3 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Optical communications using spectral interferometry14 Sep 2010US 7,796,268 B2Attochron, LLC
- Wavelength variation measuring apparatus20 Feb 1996US 5,493,395 ACanon Kabushiki Kaisha
- Apparatus and a method for high numerical aperture microscopic examination of materials15 Jun 1993US 5,220,403 AInternational Business Machines Corporation
- Apparatus and a method for high numerical aperture microscopic examination of materials4 May 1993US 5,208,648 AInternational Business Machines Corporation
- Method and apparatus for two-wavelength interferometry with optical heterodyne processes and use for position or range finding13 Mar 1990US 4,907,886 AWild Heerburgg, AG
Most cited
By later US patents
- Apparatus and a method for high numerical aperture microscopic examination of materials158US 5,220,403 AInternational Business Machines Corporation · 1993
- Apparatus and a method for high numerical aperture microscopic examination of materials102US 5,208,648 AInternational Business Machines Corporation · 1993
- Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom72US 4,764,013 AThe United States of America as represented by the United States Department of Energy · 1988
- Method and apparatus for two-wavelength interferometry with optical heterodyne processes and use for position or range finding34US 4,907,886 AWild Heerburgg, AG · 1990
- Wavelength variation measuring apparatus12US 5,493,395 ACanon Kabushiki Kaisha · 1996