G01D 3/063
Comparing the measuring value with a reference value which periodically or incidentally
Official title: {Comparing the measuring value with a reference value which periodically or incidentally scans the measuring range}
G01D3/063 (Comparing the measuring value with a reference value which periodically or incidentally) appears on 19 US grants and 6 published applications in this corpus.
Search patents in G01D- Granted patents
- 19
- Published applications
- 6
- Assignees
- 19
- Inventors
- 49
- Latest grant
- 12 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 4 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 1 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 1 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
| 2025 | 2 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Multi-dimensional precision spot inspection method and system for thermal power equipment12 Aug 2025US 12,385,761 B2Huaneng Jinan Huangtai Power Generation Co., Ltd.
- Electronic apparatus for controlling sensor and operation method thereof11 Feb 2025US 12,222,224 B2Agency for Defense Development
- Method and control apparatus for determining reference values of a sensor21 Sep 2021US 11,125,326 B2ZF Friedrichshafen AG
- Measurement result display device and measurement result display method7 May 2019US 10,279,376 B2Anritsu Corporation
- Method for determining at least one first internal parameter of a sensor4 Jun 2013US 8,456,174 B2Continental Teves AG & Co. oHG
- Multi-dimensional precision spot inspection method and system for thermal power equipment22 Aug 2024US 2024/0280378 A1Huaneng Jinan Huangtai Power Generation Co., Ltd.
- Electronic apparatus for controlling sensor and operation method thereof16 Jun 2022US 2022/0187100 A1Agency for Defense Development
- Method and Control Apparatus for Determining Reference Values of a Sensor4 Jun 2020US 2020/0173547 A1ZF Friedrichshafen AG
- Systems and methods for recalibrating a measurement instrument30 Aug 2018US 2018/0246142 A1West Energy Support & Technology, Inc.
- Measurement result display device and measurement result display method23 Aug 2018US 2018/0236496 A1Anritsu Corporation
Most cited
By later US patents
- Side scan sonar system26US 4,063,212 AWestern Marine Electronics, Inc. · 1977
- Method and apparatus for reproducing a reference position in an incremental measuring device25US 4,530,155 ADr. Johannes Heidenhain GmbH · 1985
- Digital display measuring apparatus9US 4,593,473 AMitutoyo Mfg. Co., Ltd. · 1986
- Filter with hysteresis for trip point applications9US 5,233,329 ADelco Electronics Corporation · 1993
- Method for detecting origin point of position sensor8US 5,534,692 ASony Corporation · 1996