Multi-dimensional precision spot inspection method and system for thermal power equipment

A multi-dimensional spot inspection system for thermal power equipment, comprising:

• multiple testing instruments that are used for offline testing of thermal power equipment;
• one or more processors;
• memory storing instructions, executable by the one or more processors, that, when executed by the one or more processors, cause the one or more processors to:
• read an equipment to be inspected, and an importance index of the equipment to be inspected, which are stored in the memory, and determine an initial test period of the equipment to be inspected according to the importance index;
• acquire historical spot inspection information of the equipment to be inspected, which is stored in the memory, adjust the initial test period of the equipment to be inspected according to the historical spot inspection information, so as to obtain a first test period which will be stored in the memory;
• send first testing instructions to the multiple testing instruments to perform the spot inspection on the equipment to be inspected according to the first test period, obtain the spot inspection results within the first test period, continue to send the first testing instructions to the multiple testing instruments to perform the spot inspection on the equipment to be inspected according to the first test period when the spot inspection result is less than the standard value, adjust the first test period to obtain a second test period when the spot inspection result is more than or equal to the standard value, and to send second testing instructions to the multiple testing instruments to perform the spot inspection on the equipment to be inspected according to the second test period;
• and
• send maintenance instructions for the thermal power equipment to maintenance personnel based on the spot inspection results performed in the first test period or the spot inspection results performed in the second test period;
• wherein when the one or more processors are used to determine the initial test period of the equipment to be inspected according to the importance index, the the one or more processors are specifically used to:
• determine the importance index A0 of the equipment to be inspected, preset the first preset importance index A1, the second preset importance index A2, the third preset importance index A3 and the fourth preset importance index A4, and A1>A2>A3>A4;
• preset the first preset test period T1, the second preset test period T2, the third preset test period T3 and the fourth preset test period T4, and 0<T1<T2<T3<T4;
• determine the initial test period of the equipment to be inspected according to the relationship between the importance index A0 and each preset importance index;
• when A0≥A1, select the first preset test period T1 as the initial test period of the equipment to be inspected;
• when A1>A0≥A22, select the second preset test period T2 as the initial test period of the equipment to be inspected;
• when A2>A0≥A3, select the third preset test period T3 as the initial test period of the equipment to be inspected;
• when A3>A≥A4, select the fourth preset test period T4 as the initial test period of the equipment to be inspected;
• after the ith preset test period Ti is selected as the initial test period of the equipment to be inspected, i=1,2,3,4, and then the initial test period of the equipment to be inspected is Ti at this time, which is denoted as the initial test period Ti;
• wherein when the one or more processors are used to acquire the historical spot inspection information of the equipment to be inspected, which is stored in the memory, adjust the initial test period of the equipment to be inspected according to the historical spot inspection information, so as to obtain the first test period, the one or more processors are specifically used to:
• after determining the initial test period Ti, acquire the historical spot inspection information of the equipment to be inspected, which includes the historical spot inspection result data and the historical maintenance data of the equipment to be inspected, and adjust the initial test test period Ti according to the historical spot inspection result data and the historical maintenance data;
• wherein,
• after obtaining the historical inspection check information, determine whether the historical spot inspection result data and the historical maintenance data are obtained:
• if only the historical spot inspection result data is obtained, determine the difference between two adjacent historical spot inspection result data, adjust the initial test period Ti according to the difference between two adjacent historical spot inspection result data to obtain the first test period;
• if both the historical spot inspection result data and the historical maintenance data are obtained, determine the difference between two adjacent historical spot inspection result data, obtain the historical maintenance frequency of the equipment to be inspected, adjust the initial test period Ti according to the difference between two adjacent historical spot inspection result data, and then correct the adjusted initial test period Ti according to the historical maintenance frequency to obtain the first test period;
• wherein when the one or more processors are used to adjust the initial test period Ti based on the difference between two adjacent historical spot inspection result data, the one or more processors are specifically used to:
• after obtaining the historical spot inspection result data, establish the historical result matrix B according to the historical spot inspection result data, set B (C1, D1, E1, C2, D2, E2, C3, D3, E3, . . . , Cn, Dn, En), where C1 to Cn are overall vibration values of the equipment to be inspected which are respectively obtained from the 1st spot inspection to the nth spot inspection, D1 to Dn are infrared temperature values of the equipment to be inspected which are respectively obtained from the 1st spot inspection to the nth spot inspection, E1 to En are ultrasonic values of the equipment to be inspected which are respectively obtained from the 1st spot inspection to the nth spot inspection;
• preset the preset overall vibration difference c0, the preset standard infrared temperature difference do and the preset standard ultrasonic difference e0;
• preset the first preset adjustment coefficient z1, the second preset adjustment coefficient z2 and the third preset adjustment coefficient z3, and 1>z1>z2>z3>0.8;
• obtain the overall vibration values, the infrared temperature values and the ultrasonic values within the last two periods in the historical result matrix B, obtain two adjacent overall vibration differences, denoted as Cn-1-Cn, obtain two adjacent infrared temperature differences, denoted as Dn-1-Dn, and obtain two adjacent ultrasonic differences, denoted as En-1-En;
• compare Cn-1-Cn, Dn-1-Dn and En-1-En with c0, d0 and e0 respectively, and select the adjustment coefficient according to the comparison results to adjust the initial test period Ti:
• when Cn-1-Cn≤c0, Dn-1-Dn≤d0 and En-1-En≤e0, the initial test period Ti is not adjusted;
• when Cn-1-Cn>c0, Dn-1-Dn≤d0 and En-1-En≤e0, or Cn-1-Cn≤c0, Dn-1-Dn>d0 and En-1-En≤e0, or Cn-1-Cn≤c0, Dn-1-Dn≤d0 and En-1-En>e0, select the first preset adjustment coefficient z1 to adjust the initial test period Ti, the adjusted initial test period is Ti*z1, and Ti*z1 is an integer;
• when Cn-1-Cn>c0, Dn-1-Dn>d0 and En-1-En≤e0, or Cn-1-Cn≤c0, Dn-1-Dn>d0 and En-1-En>e0, or Cn-1-Cn>c0, Dn-1-Dn≤d0 and En-1-En>e0, select the second preset adjustment coefficient z2 to adjust the initial test period Ti, the adjusted initial test period is Ti*z2, and Ti*z2 is an integer;
• when Cn-1-Cn>c0, Dn-1-Dn>d0 and En-1-En>e0, select the third preset adjustment coefficient z3 to adjust the initial test period Ti, the adjusted initial test period is Ti*z3, and Ti*z3 is an integer;
• after the mth preset adjustment coefficient zm is selected to adjust the initial test period Ti, m=1,2,3, and then the adjusted initial test period Ti*zm is taken as the first test period.