G01B 9/02096
Detecting a contour or curvature
Official title: {detecting a contour or curvature}
G01B9/02096 (Detecting a contour or curvature) appears on 24 US grants and 15 published applications in this corpus.
Search patents in G01B- Granted patents
- 24
- Published applications
- 15
- Assignees
- 16
- Inventors
- 44
- Latest grant
- 10 Oct 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 2 |
| 2012 | 1 | 1 |
| 2013 | 0 | 2 |
| 2014 | 3 | 1 |
| 2015 | 0 | 0 |
| 2016 | 2 | 0 |
| 2017 | 2 | 2 |
| 2018 | 0 | 1 |
| 2019 | 3 | 1 |
| 2020 | 1 | 1 |
| 2021 | 1 | 1 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Surface sensing probe and methods of use10 Oct 2023US 11,781,855 B2
- Method and apparatus for remote sensing of objects utilizing radiation speckle2 Mar 2021US 10,935,364 B2
- Measuring surface roughness25 Feb 2020US 10,571,244 B2ROLLS-ROYCE plc
- Vibration measurement device11 Jun 2019US 10,317,190 B2Shimadzu Corporation
- Method and apparatus for remote sensing of objects utilizing radiation speckle7 May 2019US 10,281,257 B2
- Interferometric laser speckle contrast imaging system and method9 Jul 2026US 2026/0194340 A1The Medical College of Wisconsin, Inc.
- Surface sensing probe and methods of use18 Nov 2021US 2021/0356250 A1
- Method and apparatus for remote sensing of objects utilizing radiation speckle23 Jan 2020US 2020/0025552 A1
- Measuring surface roughness16 May 2019US 2019/0145755 A1ROLLS-ROYCE plc
- Vibration measurement device4 Oct 2018US 2018/0283847 A1Shimadzu Corporation
Most cited
By later US patents
- Optically phased-locked speckle pattern interferometer50US 4,913,547 A1990
- Optical three-dimensional profilometry method based on processing SPECKLE images in partially coherent light, and interferometer implementing such a method39US 5,870,196 AEuropean Community · 1999
- Apparatus for electronic speckle pattern interferometry26US 6,188,482 B1Board of Trustees operating Michigan State University · 2001
- Method and apparatus for remote sensing of objects utilizing radiation speckle13US 8,265,375 B22012
- Aperture sampling coherence sensor and method7US 4,934,815 AEnvironmental Research Institute of Michigan · 1990