G01B 21/30
Measuring arrangements or details thereof, where the measuring technique is not covered
Official title: for measuring roughness or irregularity of surfaces
G01B21/30 (Measuring arrangements or details thereof, where the measuring technique is not covered) appears on 229 US grants and 259 published applications in this corpus.
Search patents in G01B- Granted patents
- 229
- Published applications
- 259
- Assignees
- 204
- Inventors
- 706
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 4 | 0 |
| 1995 | 1 | 0 |
| 1996 | 5 | 0 |
| 1997 | 6 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 4 | 0 |
| 2001 | 5 | 0 |
| 2002 | 10 | 5 |
| 2003 | 6 | 5 |
| 2004 | 5 | 6 |
| 2005 | 4 | 3 |
| 2006 | 6 | 4 |
| 2007 | 4 | 8 |
| 2008 | 4 | 3 |
| 2009 | 5 | 8 |
| 2010 | 4 | 3 |
| 2011 | 4 | 6 |
| 2012 | 6 | 4 |
| 2013 | 4 | 9 |
| 2014 | 4 | 12 |
| 2015 | 8 | 10 |
| 2016 | 12 | 14 |
| 2017 | 6 | 14 |
| 2018 | 7 | 12 |
| 2019 | 10 | 18 |
| 2020 | 10 | 18 |
| 2021 | 13 | 30 |
| 2022 | 20 | 21 |
| 2023 | 8 | 17 |
| 2024 | 8 | 13 |
| 2025 | 16 | 6 |
| 2026 | 7 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and system for the recognition of the irregularities of a road pavement25 Aug 2026US 12,715,445 B2
- Apparatus for detecting road surface condition11 Aug 2026US 12,703,367 B2Hl Klemove Corp.
- Surface texture detection and emulation2 Jun 2026US 12,644,701 B1Apple Inc.
- Surface analyst end effector for industrial robot14 Apr 2026US 12,600,041 B2Wichita State University
- Mobile turf instrument apparatus17 Feb 2026US 12,553,715 B2The Toro Company
- Print correction method and droplet ejection head therefor10 Sep 2026US 2026/0264416 A1Axalta Coating Systems IP Co., LLC
- Raised access floor planarity measuring equipment and elevating mechanism16 Jul 2026US 2026/0202195 A1Vero Veria Corporation
- Mobile turf instrument apparatus25 Jun 2026US 2026/0177378 A1The Toro Company
- Determining roughness and index of refraction of a material28 May 2026US 2026/0146946 A1Adobe Inc.
- Apparatus and method for measuring irregularity of permanent magnet track14 May 2026US 2026/0131834 A1Southwest Jiaotong University
Most cited
By later US patents
- Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method103US 7,230,680 B2Kabushiki Kaisha Toshiba · 2007
- Method and system for determining condition of road74US 6,202,020 B1Meritor Heavy Vehicle Systems, LLC · 2001
- Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection69US 9,291,554 B2KLA-Tencor Corporation · 2016
- Smart filing system51US 6,725,125 B2International Business Machines Corporation · 2004
- Dynamic track stiffness measurement system and method46US 6,405,141 B1Ensco, Inc. · 2002