TimeGate Instruments Oy
Oulu, FI· latest recorded location
TimeGate Instruments Oy is named on 3 US grants and 5 published applications in this corpus. Its most frequent classification is G01J (Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of).
- Granted patents
- 3
- Published applications
- 5
- Inventors
- 10
- Granted in 2026 so far
- 0
- Most recent grant
- 23 Apr 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2017 | 0 | 1 |
| 2018 | 0 | 1 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 0 | 2 |
| 2023 | 1 | 0 |
| 2024 | 1 | 0 |
By publication year.
Technology areas
Share of 8 documents
- G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of8
- G01NInvestigating or analysing materials by determining their chemical or physical properties6
- G02BOptical elements, systems or apparatus3
- A61BMedical diagnosis and surgery1
- H01SDevices using the process of light amplification by stimulated emission of radiation1
Recent patents
- Apparatus for measuring Raman spectrum and method thereof23 Apr 2024US 11,965,779 B2
- Apparatus and method for measuring spectral components of Raman scattered light28 Feb 2023US 11,592,680 B2
- Method and apparatus for measuring inelastic scattering6 Aug 2019US 10,371,641 B2
- Apparatus for measuring raman spectrum and method thereof24 Nov 2022US 2022/0373392 A1
- Apparatus and method for measuring spectral components of raman scattered light14 Jul 2022US 2022/0221730 A1
- Method and apparatus for measuring spectrum of raman-scattered light using time gated detection30 Sep 2021US 2021/0298604 A1
- Method and apparatus for measuring raman spectrum6 Sep 2018US 2018/0252649 A1
- Method and apparatus for measuring inelastic scattering17 Aug 2017US 2017/0234797 A1
Most cited
By later US patents