Method and apparatus for measuring inelastic scattering
AssigneeTimeGate Instruments Oy
InventorsJuha KOSTAMOVAARA, Ilkka NISSINEN, Jan NISSINEN, Rami AIKIO, Jussi TENHUNEN, Lauri KURKI
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AssigneeTimeGate Instruments Oy
InventorsJuha KOSTAMOVAARA, Ilkka NISSINEN, Jan NISSINEN, Rami AIKIO, Jussi TENHUNEN, Lauri KURKI
Estimating the term…
An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.
A method for measuring Raman scattering, the method comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.