Temet Instruments Oy
Helsinki, FI· latest recorded location
Temet Instruments Oy is named on 4 US grants and 0 published applications in this corpus. Its most frequent classification is G01J (Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of).
- Granted patents
- 4
- Published applications
- 0
- Inventors
- 3
- Granted in 2026 so far
- 0
- Most recent grant
- 17 Oct 1995
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
By publication year.
Technology areas
Share of 4 documents
- G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of3
- G01BMeasuring length, thickness or similar linear dimensions1
- G01NInvestigating or analysing materials by determining their chemical or physical properties1
- G01RMeasuring electric variables1
- G06FComputing and data processing1
Recent patents
- Mirror arrangement in a focusing interferometer17 Oct 1995US 5,459,572 A
- Movable mirror mounting mechanism in a scanning interferometer10 Oct 1995US 5,457,531 A
- Procedure for enhancing resolution of spectral information21 Mar 1995US 5,400,265 A
- Procedures for analyzing multicomponent FT-IR spectra for unknown mixtures of gases17 May 1994US 5,313,406 A
No published applications.
Most cited
By later US patents
- Procedure for enhancing resolution of spectral information26US 5,400,265 A1995
- Procedures for analyzing multicomponent FT-IR spectra for unknown mixtures of gases19US 5,313,406 A1994
- Mirror arrangement in a focusing interferometer4US 5,459,572 A1995
- Movable mirror mounting mechanism in a scanning interferometer2US 5,457,531 A1995