Procedure for enhancing resolution of spectral information
AssigneeTemet Instruments Oy
InventorJyrki Kauppinen
Life of this patent
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Abstract
A procedure for enhancing the resolution of spectral data, in which the Fourier self-deconvolution method FSD is used to produce from the input spectrum a data set in an interval 0-L.sub.t, the maximum entropy method MEM is used to compute prediction error filter coefficients {a.sub.k } from this data, and by the linear prediction method LP, using coefficients {a.sub.k } and data points 0 to M. Data are predicted in the interferogram I(x) beyond L.sub.t, whereby output spectrum maximum line narrowing with minimum distortion is achieved.
Claims8
A method of examining a sample to determine the presence or absence of a component therein comprising:
- producing a spectral image of a sample in the form of spectral data,
- spectroscopically producing spectral data from a sample representing the composition of said sample,
- producing from said spectral data an interferogram of said sample between 0 and L.sub.f ;
- producing by the Fourier self-deconvolution method FSD a data set from the obtained interferogram in an interval from 0 to L.sub.t where L.sub.t <L.sub.f, said data set comprising data points O to M where M is the number of data points in said data set;
- computing from said data set by the maximum entropy method MEM prediction error filter coefficients {a.sub.k }, where k=0,1,2,. . .M;
- predicting data beyond L.sub.t in the interferogram using said prediction error filter coefficients {a.sub.k }, and the data points 0 to M in said data set to achieve maximum line narrowing with minimum distortion in the resulting spectrum, and
- examining lines in said spectrum to detect presence or absence of a component in the composition of said sample, whereby the narrowing of the lines and the minimization of distortion facilitates the examination and detection of said component.
Dependencies are inferred from the claim text.