Probe Technology
Santa Clara, CA, US· latest recorded location
Probe Technology is named on 8 US grants and 0 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 8
- Published applications
- 0
- Inventors
- 3
- Granted in 2026 so far
- 0
- Most recent grant
- 20 Mar 2001
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
By publication year.
Technology areas
Share of 8 documents
Recent patents
- Assembly structure for making integrated circuit chip probe cards20 Mar 2001US 6,204,674 B1
- High temperature probe card for testing integrated circuits16 May 2000US 6,064,215 A
- Assembly structure for making integrated circuit chip probe cards23 Mar 1999US 5,884,395 A
- Method and apparatus for aligning probes12 May 1998US 5,751,157 A
- Membrane for holding a probe tip in proper location21 Apr 1998US 5,742,174 A
No published applications.
Most cited
By later US patents
- Large scale protrusion membrane for semiconductor devices under test with very high pin counts188US 5,422,574 A1995
- Membrane for holding a probe tip in proper location136US 5,742,174 A1998
- Method for making a probe preserving a uniform stress distribution under deflection119US 5,720,098 A1998
- Assembly structure for making integrated circuit chip probe cards41US 5,884,395 A1999
- High temperature probe card for testing integrated circuits40US 6,064,215 A2000