US 5,751,157 AGranted

Method and apparatus for aligning probes

AssigneeProbe Technology

InventorJanuary Kister

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Abstract

This invention presents a method for aligning a set of probes in a circuit testing apparatus with a set of pads of a circuit under test and the apparatus designed according to this method. The alignment includes the steps of selecting a first group G1 of probes from the set, such that all probes in group G1 have the same tip length L1 and the same beam length L2, and mounting each probe of group G1 on a first mounting block which has a first through-hole for each probe and a first removable portion which includes the first through-hole. During the mounting step the tip portion is placed in the through-hole, the mounting portion is attached to the first mounting block and the first removable portion is discarded. Then, a second mounting block is placed on the first mounting block and a second group G2 of probes selected from the set is mounted it in the same manner as group G1 on the first block. The blocks are aligning on top of each other by using guide holes and positioning holes in conjunction with a corresponding vertical fixing pin and a tiltable positioning pin.

Claims36

Dependent claims

A method of aligning a set of probes of a circuit testing apparatus with a set of pads of a circuit under test, each probe of said set of probes having a tip portion of tip length L1, a beam portion of beam length L2 and a mounting portion, said method comprising the following steps:

a) selecting a first group G1 of probes from said set of probes, such that each probe of said first group G1 has the same tip length L1 and each probe of said first group G1 has the same beam length L2;
b) mounting each probe of said first group G1 on a first mounting block, said first mounting block having a first through-hole for each probe of said first group G1 and a first removable portion comprising said first through-hole, said mounting step comprising:
1) placing said tip portion in said first through-hole;
2) attaching said mounting portion to said first mounting block;
3) discarding said first removable portion, such that said beam portion L2 extends unsupported past said first mounting block;
c) placing a second mounting block on said first mounting block;
d) selecting a second group G2 of probes from said set of probes, such that each probe of said second group G2 has the same tip length L1 and each probe of said second group G2 has the same beam length L2;
e) mounting each probe of said second group G2 on said second mounting block, said second mounting block having a second through-hole for each probe of said second group G2 and a second removable portion comprising said second through-hole, said mounting step comprising:
1) placing said tip portion in said second through-hole;
2) attaching said mounting portion to said second mounting block;
3) discarding said second removable portion, such that said beam portion L2 extends unsupported past said second mounting block;
and
f) aligning said first mounting block with said second mounting block.

10 more elements

a) selecting a first group G1 of probes from said set of probes, such that each probe of said first group G1 has the same tip length L1 and each probe of said first group G1 has the same beam length L2;
b) mounting each probe of said first group G1 on a first mounting block, said first mounting block having a first through-hole for each probe of said first group G1 and a first removable portion comprising said first through-hole, said mounting step comprising:
1) placing said tip portion in said first through-hole;
2) attaching said mounting portion to said first mounting block;
3) discarding said first removable portion;
4) applying a first filler to said first mounting block under said mounting portion such that said beam portion L2 extends unsupported past said first filler;
c) placing a second mounting block on said first mounting block;
d) selecting a second group G2 of probes from said set of probes, such that each probe of said second group G2 has the same tip length L1 and each probe of said second group G2 has the same beam length L2;
e) mounting each probe of said second group G2 on said second mounting block, said second mounting block having a second through-hole for each probe of said second group G2 and a first removable portion comprising said second through-hole, said mounting step comprising:
1) placing said tip portion in said second through-hole;
2) attaching said mounting portion to said second mounting block;
3) discarding said second removable portion;
4) applying a second filler to said second mounting block under said mounting portion such that said beam portion L2 extends unsupported past said second filler;
f) aligning said first mounting block with said second mounting block.

11 more elements

An apparatus for aligning a set of probes of a circuit testing apparatus with a set of pads of a circuit under test, each probe of said set of probes having a tip portion of tip length L1, a beam portion of beam length L2 and a mounting portion, said apparatus comprising:

a) a first group G1 of probes selected from said set of probes, such that each probe of said first group G1 has the same tip length L1 and each probe of said first group G1 has the same beam length L2;
b) a first mounting block having a first through-hole for each probe of said first group G1, such that each probe of said first group G1 has said tip portion in said first through-hole and said mounting portion attached to said first mounting block, said first mounting block further having a first removable portion comprising said first through-hole, such that when said first removable portion is discarded said beam portion L2 extends unsupported past said first mounting block;
c) a second group G2 of probes selected from said set of probes, such that each probe of said second group G2 has the same tip length L1 and each probe of said second group G2 has the same beam length L2;
d) a second mounting block placed on said first mounting block, said second mounting block having a second through-hole for each probe of said second group G2, such that each probe of said second group G2 has said tip portion in said second though-hole and said mounting portion attached to said second mounting block, said second mounting block further having a second removable portion comprising said second through-hole, such that when said second removable portion is discarded said beam portion L2 extends unsupported past said second mounting block;
and
e) an aligning means for aligning said second mounting block with said first mounting block.

3 more elements

a) a first group G1 of probes selected from said set of probes, such that each probe of said first group G1 has the same tip length L1 and each probe of said first group G1 has the same beam length L2;
b) a first mounting block having a first through-hole for each probe of said first group G1, such that each probe of said first group G1 has said tip portion in said first through-hole and said mounting portion attached to said first mounting block, said first mounting block further having a first removable portion comprising said first through-hole, such that when said first removable portion is discarded said beam portion L2 and a part of said mounting portion extend unsupported past said first mounting block;
c) a first filler applied to said first mounting block under said part of said mounting portion, such that only said beam portion L2 extends unsupported past said first filler;
d) a second group G2 of probes selected from said set of probes, such that each probe of said second group G2 has the same tip length L1 and each probe of said second group G2 has the same beam length L2;
e) a second mounting block placed on said first mounting block, said second mounting block having a second through-hole for each probe of said second group G2, such that each probe of said second group G2 has said tip portion in said second though-hole and said mounting portion attached to said second mounting block, said second mounting block further having a second removable portion comprising said second through-hole, such that when said second removable portion is discarded said beam portion L2 and a part of said mounting portion extend unsupported past said second mounting block;
f) a second filler applied to said second mounting block under said part of said mounting portion, such that only said beam portion L2 extends unsupported past said second filler;
and
g) an aligning means for aligning said second mounting block with said first mounting block.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application: 08/681,226Filed 22 Jul 1996
Granted: 12 May 1998
Term ends: Not estimatedThe source records don’t support an estimate.

Classification3 codes

G01R 1/07342
With individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or…:…
G01R 1/07364
With individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or…:…
G01R
Measuring electric variables

Family

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