Avatech, Inc.
Park City, UT, US· latest recorded location
AVATECH, INC. is named on 3 US grants and 6 published applications in this corpus. Its most frequent classification is G01B (Measuring length, thickness or similar linear dimensions).
- Granted patents
- 3
- Published applications
- 6
- Inventors
- 6
- Granted in 2026 so far
- 0
- Most recent grant
- 11 Oct 2016
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2014 | 0 | 5 |
| 2015 | 2 | 1 |
| 2016 | 1 | 0 |
By publication year.
Technology areas
Share of 9 documents
- G01BMeasuring length, thickness or similar linear dimensions9
- G01NInvestigating or analysing materials by determining their chemical or physical properties9
- G01WMeteorology9
- G08CTransmission systems for measured values, control or similar signals8
- H04QSelecting1
- Y10TTechnical subjects covered by former us classification1
Recent patents
- Methods, apparatus and systems for measuring snow structure and stability11 Oct 2016US 9,465,020 B2
- Methods, apparatus and systems for measuring snow structure and stability16 Jun 2015US 9,057,803 B2
- Methods, apparatus and systems for measuring snow structure and stability16 Jun 2015US 9,057,804 B2
- Methods, apparatus and systems for measuring snow structure and stability10 Dec 2015US 2015/0355152 A1
- Methods, apparatus and systems for measuring snow structure and stability18 Dec 2014US 2014/0366648 A1
- Methods, apparatus and systems for measuring snow structure and stability1 May 2014US 2014/0116127 A1
- Methods, apparatus and systems for measuring snow structure and stability1 May 2014US 2014/0116157 A1
- Methods, apparatus and systems for measuring snow structure and stability1 May 2014US 2014/0116162 A1
Most cited
By later US patents