Methods, apparatus and systems for measuring snow structure and stability
AssigneeAvatech, Inc.
InventorsJames Loren Christian, Samuel Tileston Whittemore, Brinton Johnston Wadsworth Markle
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AssigneeAvatech, Inc.
InventorsJames Loren Christian, Samuel Tileston Whittemore, Brinton Johnston Wadsworth Markle
Estimating the term…
The present inventions relate generally to methods, apparatus and systems for measuring snow stability and structure which may be used to assess avalanche risk. The disclosed apparatus includes a sensing unit configured to measure a size of snow grains as the sensing unit is being driven into a layer of snow. The disclosed apparatus may also be configured to take other environmental measurements, including resistance to penetration, temperature, humidity, slope aspect and inclination. Methods and apparatus are also disclosed for generating a profile of snow grain size according to depth based on the measured size of snow grains. Systems and apparatus are also disclosed for sharing the generated profiles among a plurality of users via a central server, and for evaluating an avalanche risk at a geographic location.
An apparatus for measuring snow structure and stability comprising:
A method for measuring snow structure and stability comprising:
Dependencies are inferred from the claim text.