Array Analysis, Inc.
Ithaca, NY, US· latest recorded location
Array Analysis, Inc. is named on 5 US grants and 0 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 5
- Published applications
- 0
- Inventors
- 2
- Granted in 2026 so far
- 0
- Most recent grant
- 26 Nov 1991
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 5 | 0 |
By publication year.
Technology areas
Share of 5 documents
Recent patents
- Interactive adaptive inference system26 Nov 1991US 5,068,814 A
- Array structure for use in an adaptive inference testing device3 Sep 1991US 5,046,034 A
- Method for calculating adaptive inference test figure of merit27 Aug 1991US 5,043,987 A
- System for displaying adaptive inference testing device information28 May 1991US 5,020,011 A
- Unpredictable fault detection using adaptive inference testing techniques19 Mar 1991US 5,001,714 A
No published applications.
Most cited
By later US patents
- Unpredictable fault detection using adaptive inference testing techniques37US 5,001,714 A1991
- System for displaying adaptive inference testing device information16US 5,020,011 A1991
- Method for calculating adaptive inference test figure of merit9US 5,043,987 A1991
- Array structure for use in an adaptive inference testing device8US 5,046,034 A1991
- Interactive adaptive inference system8US 5,068,814 A1991