Unpredictable fault detection using adaptive inference testing techniques

Apparatus for using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly, said adaptive inference system comprising:

• (a) testing means for performing a position-dependent, time-ordered test upon an electrical or electronic device or assembly to provide a comprehensive error analysis, said testing means comprising a library of error information, having fault data;
• (b) means for detecting and identifying faults that were unobserved nor expected to be observed or detected from a prior test or from stored data and information or bearing no direct relationship to a problem being reviewed and despite their possible physical remoteness within said electrical or electronic device or assembly;
• (c) means for storing fault data and information operatively connected to said testing means and said means for detecting and identifying,
• (d) comparing means operatively connected to said testing means, said means for detecting and identifying and said storage means for comparing said detected faults with stored fault data and information;
• and
• (e) display means connected to said comparing means for displaying all possibilities of faults within said device or assembly.

An adaptive inference test method having an ability to predict the cause of a previously unobserved fault from its relationship with other known faults during the testing of electrical or electronic devices or assemblies, said adaptive inference test method comprising the steps of:

• (a) reducing actual test failure data to a synopsis or fault pattern;
• (b) saving said failure data in a data base file on a test-by-test basis;
• (c) assigning to each test failure a fault diagnosis or comment;
• (d) comparing current test failure data with saved failure data;
• and
• (e) displaying a diagnosis of said current test failure utilizing fault diagnoses in said data base to provide a description of closely matching previous failures, whereby previously unobserved faults can be predicted.

An adaptive inference test apparatus having an ability to predict the cause of a previously unobserved fault from its relationship with other known faults during the testing of electrical or electronic devices or assemblies, said adaptive inference test apparatus comprising:

• (a) fault pattern means for reducing actual test failure data to a synopsis or fault pattern;
• (b) storing means operatively connected to said fault pattern means for saving said failure data in a database file on a test-by-test basis;
• (c) assigning means operatively connected to said storing means for assigning to each test failure a fault diagnosis or comment;
• (d) comparison means operatively connected to said storing means for comparing current test failure data with saved failure data;
• and
• (e) a display operatively connected to said comparison means for displaying a diagnosis of said current test failure utilizing fault diagnoses in said data base to provide a description of closely matching previous failures, whereby previously unobserved faults can be predicted.