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US 8,786,990 B2Granted
Driver-based distributed multi-path ESD scheme
AssigneeGlobalfoundries Singapore Pte. Ltd.
InventorsManjunatha Prabhu, Shan Ryan, Mahadeva Iyer Natarajan
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Abstract
A driver-based distributed multi-path ESD scheme is disclosed. Embodiments include providing a plurality of I/O cells, wherein each of the I/O cells includes a first driver having a first source, a first drain, and a first gate; and providing a first signal to turn on the first driver in each of the I/O cells during an ESD event to form a plurality of parallel ESD paths that include turned-on first drivers.
Claims15
A circuit comprising:
- an ESD trigger circuit;
- and
- a plurality of I/O cells, each of the I/O cells including a first driver having a first source, a first drain, and a first gate, and a second driver having a second source, a second drain, and a second gate, wherein the ESD trigger circuit provides a first signal using a first ESD trigger terminal of the ESD trigger circuit to turn on the first driver in each of the I/O cells during an ESD event and a second signal using a second ESD trigger terminal of the ESD trigger circuit to turn on the second driver in each of the I/O cells during the ESD event to form a plurality of parallel ESD paths that include turned-on first drivers and turned-on second drivers;
- wherein each of the I/O cells further includes:
- an I/O pad coupled to the first and second drains;
- and
- a compare circuit coupled to the I/O pad, wherein the compare circuit receives the first and second signals, and compares a pad voltage at the I/O pad with the first and second signals.
4 more elements
A method comprising:
- providing a plurality of I/O cells, wherein each of the I/O cells includes a first driver having a first source, a first drain, and a first gate and a second driver having a second source, a second drain and a second gate;
- and
- providing a first signal using a first ESD trigger terminal of an ESD trigger circuit to turn on the first driver in each of the I/O cells during an ESD event and a second signal using a second ESD trigger terminal of the ESD trigger circuit to turn on the second driver in each of the I/O cells during the ESD event to form a plurality of parallel ESD paths that include turned-on first drivers and turned-on second drivers;
- wherein each of the I/O cells further includes:
- an I/O pad coupled to the first and second drains;
- and
- a compare circuit coupled to the I/O pad, the method further comprising:
- receiving, at the compare circuit, the first and second signals;
- and
- comparing a pad voltage at the I/O pad with the first and second signals.
7 more elements
A ring I/O circuit comprising:
- an ESD trigger circuit having a first ESD trigger terminal and a second ESD trigger terminal;
- and
- a plurality of I/O cells, each of the I/O cells including:
- a first driver having a first source, a first drain, and a first gate;
- a second driver having a second source, a second drain, and a second gate,
- wherein first and second signals are respectively provided using the first and second ESD trigger terminals to turn on the first and second drivers in each of the I/O cells during an ESD event to form a plurality of parallel ESD paths that include turned-on first and second drivers;
- wherein each of the I/O cells further includes:
- an I/O pad coupled to the first and second drains;
- and
- a compare circuit coupled to the I/O pad, the first gate, and the second gate,
- wherein the compare circuit receives the first and second signals, and compares a pad voltage at the I/O pad with the first and second signals, and
- wherein the compare circuit provides a third signal to turn off the first driver and a fourth signal to turn off the second driver when the pad voltage is higher than the first and second signals.
9 more elements
Dependencies are inferred from the claim text.