3D stacked array having cut-off gate line and fabrication method thereof
AssigneeSnu R&Db Foundation
InventorsByung-Gook Park, Seongjae Cho, Won Bo Shim
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AssigneeSnu R&Db Foundation
InventorsByung-Gook Park, Seongjae Cho, Won Bo Shim
Estimating the term…
A three-dimensional stacked flash memory array having cut-off gate line and a fabricating method of the same are provided. The flash memory array enables to operate two memory cells by each word line, to produce a high integrity without limitation by vertical stacks of word lines, to increase operating speed and uniformity of electrical property between cells by using a single crystal substrate as a channel region, and to reduce a fabricating cost to a great amount by a fabricating method which is including steps of forming a plurality of trenches in a semiconductor substrate and stacking repeatedly a conductive material interlaid with an insulating layer from bottom of each trench to form a cut-off gate line and a plurality of word lines.
A three-dimensional stacked array having cut-off gate lines, comprising:
A three-dimensional stacked array having cut-off gate lines, comprising:
Dependencies are inferred from the claim text.