Method for replacing chlorine atoms on a film layer
AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorYang-Ling Cheng
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AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorYang-Ling Cheng
Estimating the term…
The present invention discloses a method for replacing chlorine atoms on a film layer. More particularly, sufficient replacement ions for replacing the chlorine atoms are formed in a plasma process by reducing a volume ratio of a gas in a gas mixture (i.e. the film layer may be etched with the ions formed by dissociation of the gas) and dissociation of the gas mixture further decreases the etching reaction to the film layer in a process for replacing the chlorine atoms. In comparison to a conventional process by pure oxygen, the present invention can improve the prior art re-etching problem to avoid affecting an electric property of a thin film transistor, also has an advantage of manufacturing time reduction for an increased production yield.
A method for replacing chlorine atoms on a film layer comprising the steps of:
Dependencies are inferred from the claim text.