Active device array substrate and repairing method thereof

An active device array substrate, comprising:

• a substrate having a display region and a periphery region;
• a plurality of pixels arranged in an array and disposed on the display region of the substrate;
• a plurality of signal lines electrically connected to the pixels, and respectively extended from the display region to the periphery region, wherein one of the signal lines has an open defect;
• and
• a repairing structure disposed at the periphery region, the repairing structure comprising:
• a first repairing line intersected with one ends of the signal lines,
• wherein the first repairing line is electrically floated;
• a second repairing line;
• an ESD releasing line;
• an ESD protector, electrically connected between the second repairing line and the ESD releasing line, wherein the ESD protector is overlapped with and electrically insulated from the first repairing line, there are at least one welding point at where the first repairing line is overlapped with one end of the signal line having the open defect and at least one welding point at where the ESD protector is overlapped with the first repairing line, such that the second repairing line is electrically connected to the signal line having the open defect through the ESD protector and the first repairing line.

An active device array substrate, comprising:

• a substrate having a display region and a periphery region;
• a plurality of pixels arranged in an array and disposed on the display region of the substrate;
• a plurality of signal lines electrically connected to the pixels, and respectively extended from the display region to the periphery region, wherein one of the signal lines has an open defect;
• and
• a repairing structure, disposed at the periphery region, the repairing structure comprising:
• a first repairing line, intersected with one ends of the signal lines,
• wherein the first repairing line is electrically floated;
• a second repairing line;
• an ESD releasing line;
• and
• an ESD protector, electrically connected between the second repairing line and the ESD releasing line, wherein the ESD protector comprises a plurality of diodes that are connected in series, each of the diodes comprises a first electrode, a second electrode, a control electrode electrically connected to the second electrode, and a semiconductor layer, the semiconductor layer is located between the first electrode and the second electrode, one of the first electrodes that is not electrically connected to the second electrode is electrically connected to the ESD releasing line, one of the second electrodes that is not electrically connected to the first electrode is electrically connected to the second repairing line, and the first repairing line is overlapped with one of the second electrodes;
• wherein there are at least one welding point at where the first repairing line is intersected with one end of the signal line having the open defect, at least one welding point at where the second electrode is overlapped with the first repairing line, and at least one welding point at where a part of the control electrodes is overlapped with a part of the second electrodes, such that the second repairing line is electrically connected to the signal line having the open defect through the part of the control electrodes, the part of the second electrodes, and the first repairing line.