Semiconductor device and method of monitoring blowing of fuse in semiconductor device
AssigneeSemiconductor Components Industries, LLC
InventorHiroyuki Arai
Life of this patent
Estimating the term…
Abstract
In some embodiments, a semiconductor device includes a fuse having a conductive portion configured to be blown when a current exceeding a rated value flows through the conductive portion, a first monitor wiring configured to monitor blowing of the conductive portion of the fuse, and a second monitor wiring configured to monitor blowing of the conductive portion of the fuse. The first monitor wiring and the second monitor wiring are connected to the conductive portion of the fuse so as to be away from a longitudinal center of the conductive portion.
Claims16
A semiconductor device comprising:
- a fuse having a conductive portion configured to be blown when a current exceeding a rated value flows through the conductive portion;
- a first monitor wiring configured to monitor blowing of the conductive portion of the fuse;
- and
- a second monitor wiring configured to monitor blowing of the conductive portion of the fuse,
- wherein the first monitor wiring is connected to the conductive portion of the fuse so as to be away from a longitudinal center of the conductive portion, and
- wherein the second monitor wiring is connected to the conductive portion of the fuse so as to be away from a longitudinal center of the conductive portion.
A semiconductor device comprising:
- a fuse having a conductive portion configured to be blown when a current exceeding a rated value flows through the conductive portion;
- a first monitor wiring configured to monitor blowing of the conductive portion of the fuse;
- and
- a second monitor wiring configured to monitor blowing of the conductive portion of the fuse,
- wherein the first monitor wiring and the second monitor wiring are connected to the conductive portion of the fuse so as to be positioned within a blow-off target area of the conductive portion of the fuse.
A method of monitoring blowing of a fuse in a semiconductor device, the method comprising:
- providing a fuse in the semiconductor device, the fuse having a conductive portion configured to be blown when a current exceeding a rated value flows through the conductive portion;
- providing a first monitor wiring and a second monitor wiring in the semiconductor device so that the first and second monitor wirings are connected to the conductive portion of the fuse so as to be away from a longitudinal center of the conductive portion, the first monitor wiring and the second monitor wiring being configured to monitor blowing of the conductive portion of the fuse;
- and
- monitoring electric disconnection of the conductive portion of the fuse using the first monitor wiring and second monitor wiring to confirm, after blowing of the conductive portion of the fuse, whether or not remaining portions of the fuse and the first and second monitor wirings are electrically disconnected with each other.
Dependencies are inferred from the claim text.