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US 7,889,323 B2Granted
Wafer stage and related method
AssigneeSamsung Electronics Co., Ltd.
InventorMin-Sang Sung
Life of this patent
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Abstract
There are provided a wafer stage and methods for chucking a wafer using the same. The wafer stage includes a wafer chuck adapted to hold a wafer; lift pins adapted to pass through the wafer chuck, move vertically, and support the wafer; and an air expulsion unit adapted to expel air towards an edge of the wafer. The method for attaching a wafer to a wafer chuck comprises lowering lift pins supporting the wafer; and expelling air towards an edge of the wafer using an air expulsion unit.
Claims10
A wafer stage comprising:
- a wafer chuck adapted to hold a wafer during a fabrication process, the wafer chuck comprising
- a body,
- a plurality of chucking protrusions disposed on a central portion of an upper surface of the body and adapted to contact the wafer when the wafer is seated on the wafer chuck, and
- an outer edge ring comprising concentrically disposed first and second edge rings disposed on the upper surface of the body and adapted to contact an outer edge of the wafer;
- lift pins adapted to pass through the wafer chuck, move vertically, and support the wafer as the wafer is placed on the wafer chuck during a wafer loading operation before the fabrication process, and as the wafer is removed from the wafer chuck during a wafer unloading operation after the fabrication process;
- a vacuum unit adapted to apply suction to a first portion of the outer edge of the wafer through a plurality of vacuum holes formed through the first edge ring to seat the wafer on the wafer chuck;
- an air expulsion unit adapted to expel air towards a second portion of the outer edge of the wafer through a plurality of air expulsion holes formed in the second edge ring to prevent the wafer from sagging during the wafer loading operation;
- and
- a controller adapted to control operation of the air expulsion unit such that air is expelled towards the second portion of the outer edge of the wafer only after suction is applied to the first portion of the outer edge of the wafer, and such that suction on the first portion of the outer edge of the wafer and expulsion of air towards the second portion of the outer edge of the wafer are coincidently applied during the wafer loading operation.
6 more elements
Dependencies are inferred from the claim text.