Semiconductor device and manufacturing method thereof

A method of manufacturing a semiconductor device comprising:

• forming a first material for a gate insulator on a semiconductor layer, the semiconductor layer being made of germanium or gallium arsenide having a first oxide-generating Gibbs free energy required to become an oxide, said first material containing an element having a second oxide-generating Gibbs free energy required to become an oxide and becoming insulative when the element is oxidized;
• and
• forming a second material for a gate electrode on the first material, said second material containing an element having a third oxide-generating Gibbs free energy required to become an oxide;
• and
• annealing the first material in a temperature range where the first oxide-generating Gibbs free energy and the third oxide-generating Gibbs free energy are higher than the second oxide-generating Gibbs free energy, the annealing being conducted to oxidize the first material, the annealing being conducted to prevent forming an oxide of the semiconductor layer at an interface between the semiconductor layer and the first material and to prevent forming an oxide of the second material at an interface between the first material and the second material,
• wherein the first material contains at least one material from among Si, Zr, Hf, Ti, Al, La, Pr, Y, Ce, Sr, Dy, Er, Lu and Gd.

A method of manufacturing a semiconductor device comprising:

• forming a first oxide film for a gate insulator on a semiconductor layer, the semiconductor layer being made of germanium or gallium arsenide having a first oxide-generating Gibbs free energy required to become an oxide, said first oxide film containing an element having a second oxide-generating Gibbs free energy required to become an oxide and becoming insulative when the element is oxidized, wherein a second oxide film of the semiconductor layer is formed between the first oxide film and the semiconductor layer, when the first oxide film is formed;
• and
• the method further comprising:
• annealing the second oxide film in an atmosphere containing H radicals, O radicals and OH radicals, or D radicals, OD radicals and O radicals in a temperature range where the first oxide-generating Gibbs free energy is higher than the second oxide-generating Gibbs free energy, the annealing being conducted for deoxidation of the second oxide films and to prevent forming an oxide of the semiconductor layer at an interface between the semiconductor layer and the second oxide film,
• wherein the H radicals, O radicals and OH radicals are generated by discharging in an atmosphere containing water, or the D radicals, OD radicals and the O radicals are generated by discharging in an atmosphere containing heavy water.

A method of manufacturing a semiconductor device comprising:

• forming a first oxide film for a gate insulator on a semiconductor layer, the semiconductor layer being made of germanium or gallium arsenide having a first oxide-generating Gibbs free energy required to become an oxide, said first oxide film containing an element having a second oxide-generating Gibbs free energy required to become an oxide and becoming insulative when the element is oxidized, wherein a second oxide film of the semiconductor layer is formed between the first oxide film and the semiconductor layer, when the first oxide film is formed;
• and
• the method further comprising:
• forming a second material for a gate electrode on the first oxide film, said second material containing an element having a third oxide-generating Gibbs free energy required to become an oxide, wherein a third oxide film and a fourth oxide film of the second material are respectively formed between the second material and the first oxide film and on a surface of the second material, when the second material is formed, and
• the method further comprising:
• annealing the second, the third and the fourth oxide films in an atmosphere containing H radicals, O radicals and OH radicals, or D radicals, OD radicals and O radicals in a temperature range where the first oxide-generating Gibbs free energy and the third oxide-generating Gibbs free energy are higher than the second oxide-generating Gibbs free energy, the annealing being conducted to oxidize the first oxide film, the annealing being conducted for de-oxidation of the second, the third and the fourth oxide films, and the annealing being conducted to prevent forming an oxide of the semiconductor layer at an interface between the semiconductor layer and the second oxide film,
• wherein the H radicals, O radicals and OH radicals are generated by discharging in an atmosphere containing water, or the D radicals, OD radicals and the O radicals are generated by discharging in an atmosphere containing heavy water.