AFM for simultaneous recognition of multiple factors
AssigneeArizona State University
InventorsHongda Wang, Stuart Lindsay
Life of this patent
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Abstract
An atomic force microscope and a method for detecting interactions between a probe and two or more sensed agents on a scanned surface and determining the relative location of two or more sensed agents is provided. The microscope has a scanning probe with a tip that is sensitive to two or more sensed agents on said scanned surface; two or more sensing agents tethered to the tip of the probe; and a device for recording the displacement of said probe tip as a function of time, topographic images, and the spatial location of interactions between said probe and the two or more sensed agents on said surface.
Claims7
An atomic force microscope for detecting interactions between a probe and first and second sensed agents on a scanned surface, said microscope comprising:
- a scanning probe having a tip that is sensitive to a property of said scanned surface;
- first and second sensing agents tethered to the tip of the probe, said first and second sensing agents being sensitive to said first and second sensed agents, respectively, said first sensing agent being different from said second sensing agent;
- and
- means for recording a displacement of said probe tip as a function of time, recording topographic images, and recording the spatial location of interactions between said probe and said first and second sensed agents on said scanned surface.
Dependencies are inferred from the claim text.