Pattern writing apparatus and pattern writing method
AssigneeDainippon Screen Mfg. Co., Ltd.
InventorsKatsuyuki Hisaoka, Hiroyuki Shirota
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AssigneeDainippon Screen Mfg. Co., Ltd.
InventorsKatsuyuki Hisaoka, Hiroyuki Shirota
Estimating the term…
Light irradiation is performed on a strip region on a photosensitive material by main scanning of an irradiation region group on the photosensitive material where light emitted from a micromirror group of a DMD is directed and light is applied to a plurality of strip regions partially overlapping in a sub scan direction in turn while repeating the main scanning, to write a pattern on the photosensitive material. When a preceding irradiation region group and a following irradiation region group pass over an overlapping area, a part of micromirrors corresponding to the overlapping area, out of the micromirror group, are made inactivated. As a result, a cumulative passage time in which the preceding irradiation region group and the following irradiation region group pass each position of the overlapping area is shorter than a passage time where the preceding irradiation region group passes each position of a non-overlapping area.
A pattern writing apparatus for writing a pattern on a photosensitive material by light irradiation on said photosensitive material, comprising:
A pattern writing method of writing a pattern on a photosensitive material by moving an irradiation region group irradiated with light on said photosensitive material and controlling light irradiation on respective irradiation regions included in said irradiation region group to perform light irradiation on each position on said photosensitive material while a plurality of irradiation regions pass said each position, said method comprising the steps of:
Dependencies are inferred from the claim text.