Method of forming film upon a substrate
AssigneeNational Institute of Advanced Industrial Science and Technology
InventorShigeki Sakai
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AssigneeNational Institute of Advanced Industrial Science and Technology
InventorShigeki Sakai
Estimating the term…
A method of forming film on a substrate, in which in a preliminary step information on film thickness deposited on a test substrate prepared for use in collecting information over a fixed irradiation time is obtained in advance while shining a laser beam on a target, there being a fixed positional relationship between spatial positions of the test substrate and an incidence point of the laser beam on the target, or while shining the laser beam on the target while rotating the test substrate. In a main step, a deposition time at each relative positional relationship is adjusted based on film-thickness distribution information obtained in the preliminary step while spatially moving or rotating the substrate or substrate holder about a specific central axis of rotation relative to the incidence point of the laser beam to the target, or while performing both the relative rotation and relative movement.
A method of forming a film upon a substrate by means of a laser evaporation method wherein a laser beam is shined upon a target placed within an evacuated deposition chamber, so that target material in a portion of the target surface irradiated by said laser beam evaporates, and said evaporated target material is deposited upon a surface of the substrate supported by a substrate holder within said deposition chamber, said method of forming the film upon the substrate comprising:
A method of forming a film upon a substrate wherein deposition is performed while a substrate or a substrate holder supporting said substrate within a deposition chamber is moved or rotated relative to a source of supply of deposition materials about a specific axis of rotation, or while performing both relative rotation and relative movement, said method of forming the film upon the substrate comprising:
Dependencies are inferred from the claim text.