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US 7,607,343 B2Granted
System for nano position sensing in scanning probe microscopes using an estimator
AssigneeAgilent Technologies, Inc.
InventorDaniel Y Abramovitch
Life of this patent
Estimating the term…
Abstract
In accordance with the invention, an estimator is used in the controller portion of a scanning probe microscope to provide precise position estimates of the probe tip which is controlled in the vertical direction by a microelectromechanical system (MEMS) actuator. The precise position estimates typically enhance the ability of the scanning probe microscope to follow the surface and typically provide improved measurements of the surface topography.
Claims24
A scanning probe microscope system comprising:
- a microelectromechanical system actuator operable to move a flexible cantilever mechanically coupled to a probe tip;
- an optical detector optically coupled to said flexible cantilever;
- a controller, said controller electrically coupled to said microelectromechanical system actuator and electrically coupled to said optical detector;
- and
- an estimator having an estimator feedback gain, said estimator electrically coupled to said optical detector and electrically coupled to said controller where said estimator is operable to receive an error signal from said optical detector and operable to use said error signal and said estimator feedback gain to generate a state estimate, said state estimate output to said controller, said controller operable to provide a control signal to said microelectromechanical system actuator to maintain a deflection of said flexible cantilever at an approximately constant value,
- wherein said control signal depends on said state estimate.
3 more elements
The system of 1 wherein said estimator is current.
A scanning probe microscope system comprising:
- a microelectromechanical system actuator operable to move a flexible cantilever mechanically coupled to a probe tip, said microelectromechanical system actuator comprising a position sensor operable to provide absolute position information signal for said microelectromechanical system actuator;
- an optical detector optically coupled to said flexible cantilever, said optical detector operable to provide an error signal;
- a contoller operable to generate a control input signal, said controller electrically coupled to said microelectromechanical system actuator and electrically coupled to said optical detector;
- and
- an estimator having an estimator feedback gain, said estimator electrically coupled to said optical detector and electrically coupled to said controller where said estimator is operable to receive said error signal, said absolute position information signal and said control input signal, said estimator operable to use said error signal, said estimator feedback gain, said absolute position information signal and said control input signal to generate a state estimate receivable by said controller, said controller operable to provide said control input signal to said microelectromechanical system actuator to maintain a deflection of said flexible cantilever at an approximately constant value;
- wherein said control input signal depends on said state estimate.
3 more elements
Dependencies are inferred from the claim text.