Exposure method, exposure apparatus and device producing method
AssigneeNikon Corporation
InventorKen Ozawa
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AssigneeNikon Corporation
InventorKen Ozawa
Estimating the term…
In an exposure method which illuminates a first object with an exposure beam and exposes a second object through a projection system with the exposure beam passing through a pattern of the first object, a correlation between a light amount of the exposure beam detected at a measuring point on an optical path to the first object and a light amount of the exposure beam on an image plane of the projection system is previously obtained, and when an integrated exposure amount with respect to the second object is controlled based on the light amount of the exposure beam detected at the measuring point and the correlation at the time of exposure of the second object, a variation amount of transmittance of the projection system is forecast in accordance with a process condition and exposure progression, and the correlation is renewed based on the forecast variation amount of the transmittance.
An exposure method which illuminates a first object with an exposure beam emitted from a light source and exposes a second object through a projection system with the exposure beam that has passed through a pattern on the first object, comprising:
An exposure apparatus that transfers a pattern of a first object onto a second object with an exposure beam generated by an exposure light source, comprising:
Dependencies are inferred from the claim text.