Crystallographic wet chemical etching of III-nitride material
AssigneeTrustees of Boston University
InventorsE. Fred Schubert, Dean A. Stocker
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AssigneeTrustees of Boston University
InventorsE. Fred Schubert, Dean A. Stocker
Estimating the term…
A method of processing III-Nitride epitaxial layer system on a substrate. The process includes exposing non-c-plane surfaces of the III-nitride epitaxial layer system, for example by etching to a selected depth or cleaving, and crystallographical etching the epitaxial layer system in order to obtain crystallographic plane surfaces. In an exemplary embodiment, the III-Nitride epitaxial layer system includes GaN. In accordance with one aspect of the exemplary embodiment, the etching step includes reactive ion etching in a chlorine-based plasma, PEC etching in a KOH solution or cleaving, and the crystallographical etching step includes immersing the epitaxial layer system in a crystallographic etching chemical, such as phosphoric acid, molten KOH, KOH dissolved in ethylene glycol, sodium hydroxide dissolved in ethylene glycol, tetraethyl ammonium hydroxide, or tetramethyl ammonium hydroxide. Speaific etching planes are chosen in accordance with varying the orientation of the exposing step, the etching chemical, and the temperature at which the epitaxial layer system is etched.
A method of processing a III-Nitride epitaxial layer system provided on a substrate, comprising:
A method of processing a III-Nitride epitaxial layer system provided on a substrate to produce a laser diode, comprising:
A method of processing a III-Nitride epitaxial layer system provided on a substrate to produce a bipolar transistor, comprising:
A method of processing a III-Nitride epitaxial layer system comprising:
A method of processing a III-Nitride epitaxial layer system comprising:
A method of processing a III-Nitride epitaxal material system comprising:
A method of processing a GaN layer in order to produce semiconductor laser facets comprising:
Dependencies are inferred from the claim text.