Method for forming and filling isolation trenches
AssigneeInfineon Technologies North America Corp.
InventorsRajeev Malik, Mihel Seitz, Andreas Knorr
Life of this patent
Estimating the term…
Loading patent…
AssigneeInfineon Technologies North America Corp.
InventorsRajeev Malik, Mihel Seitz, Andreas Knorr
Estimating the term…
A method for forming isolation trenches for a semiconductor device forms, in a substrate, a plurality of trenches having different widths including widths above a threshold size and widths below a threshold size. The plurality of trenches have a same first depth. A masking layer is deposited in the plurality of trenches, the masking layer has a thickness sufficient to both line the trenches with the widths above the threshold size and completely fill the trenches with the widths below the threshold size. A portion of the substrate is exposed at a bottom of the trenches with the widths above the threshold size by etching the masking layer. The plurality of trenches is etched to extend the trenches with the widths above the threshold size to different depths.
A method for forming isolation trenches in semiconductor devices, comprising the steps of:
A method for forming isolation trenches in semiconductor devices, comprising the steps of:
A method for forming isolation trenches in semiconductor devices, comprising the steps:
Dependencies are inferred from the claim text.