Method for forming a metal capacitor with two metal electrodes
AssigneeUnited Microelectronics Corp.
InventorHsiu-wen Hsu
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AssigneeUnited Microelectronics Corp.
InventorHsiu-wen Hsu
Estimating the term…
The present invention provides a method of forming a metal capacitor with two metal electrodes. The first step of the present invention is providing a substrate comprising a source/drain area and a capacitor area. Then a first insulating layer is formed. A step of patterning the first insulating layer is performed to form at least one contact hole. A barrier metal layer is conformably formed on the surface of the contact hole and the insulating layer. Then a metal plug is formed in the contact hole. Then a dielectric plate with an area larger than that of the capacitor area is formed on a predetermined surface of the metal plug and the barriermetal layer. Then a metal layer is formed and patterned to define a top electrode plate, a bottom plate and at least a metal line. The top electrode plate is the metal layer on the top center of the dielectric plate, the bottom electrode plate is the barrier metal layer under the dielectric plate. Such method of forming a metal capacitor not only eliminates the need to form an extra metal layer, but also produces a capacitor meeting the requirement of low voltage coefficient of capacitance.
A method of forming a metal capacitor with two metal electrodes on a substrate of a semiconductor wafer, the semiconductor wafer comprising a gate area for a gate electrode, a source/drain area for a source/drain electrode, and a capacitor area for the metal capacitor, the method comprising the following steps:
A method of forming a metal capacitor with two metal electrodes on a substrate of a semiconductor wafer, the semiconductor wafer comprising a plurality of conductive-metal lines and a capacitor area for the metal capacitor, the method comprising the following steps:
Dependencies are inferred from the claim text.