Semiconductor devices and fabrication methods thereof
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsKun ZHANG, Linchun WU, Yuhui HAN, Tingting GAO, Wenxi ZHOU, Zhiliang XIA, Zongliang HUO
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsKun ZHANG, Linchun WU, Yuhui HAN, Tingting GAO, Wenxi ZHOU, Zhiliang XIA, Zongliang HUO
Estimating the term…
The present disclosure relates to semiconductor devices and fabrication methods thereof. The semiconductor device includes a first stack and a second stack. The first stack includes a first and second deck of conductive and insulating layers alternating with each other along the first direction. The second stack includes a first and second deck of dielectric and insulating alternating with each other along the first direction. The semiconductor device further includes a first connecting layer connecting a first conductive layer of the first deck of the first stack with a first dielectric layer of the first deck of the second stack along a second direction, and a second connecting layer connecting a second conductive layer of the second deck of the first stack with a second dielectric layer of the second deck of the second stack along the second direction.
A semiconductor device, comprising:
A semiconductor device, comprising:
A method, comprising:
Dependencies are inferred from the claim text.