Semiconductor device and method for fabricating the same
AssigneeSK hynix Inc.
InventorMin Soo KIM
Life of this patent
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AssigneeSK hynix Inc.
InventorMin Soo KIM
Estimating the term…
Disclosed are a semiconductor device with improved reliability, and a method for fabricating the semiconductor device. A semiconductor device includes a first impurity region disposed in a substrate; a second impurity region disposed in the substrate and spaced apart from the first impurity region; a bit line contact plug disposed over the first impurity region and having a multi-tapered sidewall; and a storage contact plug disposed over the second impurity region, wherein the multi-tapered sidewall of the bit line contact plug includes at least one inflection point at which a slope changes, and wherein the at least one inflection point is disposed higher than a bottom surface of the storage contact plug.
A semiconductor device comprising:
A semiconductor device comprising:
A method for fabricating a semiconductor device, the method comprising:
Dependencies are inferred from the claim text.