Extreme ultraviolet (euv) radiation source apparatus
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHSIN-FU TSENG, CHIH-CHIANG TU, CHIH-WEI WEN, CHIEN-HSING LU, TZU JENG HSU
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHSIN-FU TSENG, CHIH-CHIANG TU, CHIH-WEI WEN, CHIEN-HSING LU, TZU JENG HSU
Estimating the term…
An EUV radiation source apparatus includes an EUV source vessel including a chamber, a crucible disposed in the chamber, a catcher disposed in the chamber, a first channel, a second channel, and a first opening formed on the first channel. The catcher includes a first aperture and a second aperture separated from each other. The first channel is adjacent to the first aperture, and the second channel is adjacent to the second aperture. The first channel is configured to introduce a laser beam into the chamber, the second channel is configured to allow EUV radiation to exit the chamber, and the first opening is configured to dissipate heat or gas from the first channel.
An extreme ultraviolet (EUV) radiation source apparatus, comprising:
An extreme ultraviolet (EUV) radiation source apparatus, comprising:
An extreme ultraviolet (EUV) radiation source apparatus, comprising:
Dependencies are inferred from the claim text.