Semiconductor device structure and method for forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHsu-Tung YEN, Ling-Sung WANG
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHsu-Tung YEN, Ling-Sung WANG
Estimating the term…
A method for forming a semiconductor device structure is provided. The method includes forming a first lower conductive line over a substrate. The method includes forming a dielectric layer over the substrate and the first lower conductive line. The method includes partially removing the dielectric layer to form a first trench, a second trench and a first hole in the dielectric layer. The first hole is under and connected to the first trench, and the first hole extends toward the first lower conductive line. The method includes forming a first upper conductive line, a second upper conductive line, and a first capacitor via structure in the first trench, the second trench and the first hole respectively. A first linewidth of the first upper conductive line is less than a second linewidth of the second upper conductive line.
A method for forming a semiconductor device structure, comprising:
A method for forming a semiconductor device structure, comprising:
A semiconductor device structure, comprising:
Dependencies are inferred from the claim text.