Anti-electromagnetic interference wafer structure

Abstract

The present application discloses an anti-electromagnetic interference wafer structure in the wafer processing stage; the anti-electromagnetic interference wafer structure comprises a digital processing unit area with a digital processing unit, an insulating layer, a conducting layer and a plurality of information connectivity points wherein the digital processing unit has a top surface on which the insulating layer and the information connectivity points are designed, the insulating layer has a top surface on which the conducting layer is coated, and the conducting layer is capable of absorbing electromagnetic interferences passed on to the conducting layer.

Dependencies are inferred from the claim text.