Semiconductor test result analysis device, semiconductor test result analysis method, and recording medium

A semiconductor test result analysis method comprising:

• a step of causing a computer to acquire first data of a plurality of items related to a test process of a plurality of semiconductor chips;
• a step of causing the computer to acquire second data indicating test results of the plurality of semiconductor chips in the test process;
• and
• a step of causing the computer to generate, in a region in which a plurality of items of the first data is arranged on one axis and a plurality of values of the respective items is arranged in a direction orthogonal to the axis, a graph image in which corresponding values are connected by lines over the plurality of items for each group of a plurality of semiconductor chips having the same test environment, wherein
• the generating step changes a form of the lines for each group in the graph image according to a ratio of semiconductor chips whose test results have been failed in each group.

A non-transitory computer-readable recording medium encoded with a computer program for causing a computer to realize:

• a function of acquiring first data of a plurality of items related to a test process of a plurality of semiconductor chips;
• a function of acquiring second data indicating test results of the plurality of semiconductor chips in the test process;
• and
• a function of generating, in a region in which a plurality of items of the first data is arranged on one axis and a plurality of values of the respective items is arranged in a direction orthogonal to the axis, a graph image in which corresponding values are connected by lines over the plurality of items for each group of a plurality of semiconductor chips having the same test environment, wherein
• the generating function changes a form of the lines for each group in the graph image according to a ratio of semiconductor chips whose test results have been failed in each group.