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US 2024/0201252 A1Published application
Eop probing on multi-die stacks
AssigneeMicron Technology, Inc.
InventorsJohn M. Gonzales, Seth A. Eichmeyer, Atsuko Otsuka, Takeshi Kaku, Soeparto Tandjoeng
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Abstract
An example method can include focusing a light source onto a circuit of a first memory die of a plurality of memory dies. A light of the light source can reach the circuit of the memory die and can be reflected back toward a sensor. The method can further include receiving the reflection of light from the circuit at the sensor. The method can further include determining whether the circuit is transferring a particular signal based on the reflected light.
Claims20
An apparatus, comprising:
- a plurality of memory dies arranged in a stack, the plurality of memory dies each including a group of memory cells;
- wherein:
- each of the plurality of memory dies comprise a plurality of metallization layers;
- and
- at least two of the plurality of memory dies comprise an area devoid of their respective plurality of metallization layers and the portion of each of the at least two of the plurality of memory dies are physically in line and perpendicular to an outside surface of the stack.
2 more elements
An apparatus, comprising:
- a plurality of memory dies arranged in a stack, the plurality of memory dies each including a group of memory cells;
- wherein:
- each of the plurality of memory dies comprise a plurality of metallization layers;
- and
- a plurality of diodes are coupled to the plurality of metallization layers;
- and
- a first diode of the plurality of diodes is coupled via at least one of the plurality of metallization layers to a second diode of the plurality of diodes such that the second diode is a particular distance from any of the plurality of diodes.
4 more elements
A method, comprising:
- focusing a light source onto a circuit of a first memory die of a plurality of memory dies, wherein a light of the light source reaches the circuit of the memory die and is reflected back toward a sensor;
- receiving the reflection of light from the circuit at the sensor;
- and
- determining whether the circuit is transferring a particular signal based on the reflected light.
1 more element
Dependencies are inferred from the claim text.