Surface analysis method, surface analysis system, and surface analysis program
AssigneeShowa Denko Materials Co., Ltd.
InventorYuki ARAI
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AssigneeShowa Denko Materials Co., Ltd.
InventorYuki ARAI
Estimating the term…
A surface analysis method according to an embodiment includes: acquiring a force curve corresponding to measurement of a sample surface by a scanning probe microscope; calculating a physical quantity of an organic material forming the sample surface based on the force curve, for each of an observation point group; and outputting analysis data indicating the physical quantity of each of the observation point group. The acquiring the force curve includes acquiring the force curve at each of a plurality of observation points on a Y-column extending along a X-direction (a direction along which the probe reciprocates with respect to a stage). The calculating the physical quantity includes: generating a force curve matrix indicating the force curve at each of the plurality of observation points; and calculating the physical quantity at each of the plurality of observation points using the force curve matrix.
A surface analysis method comprising:
A Surface analysis system comprising at least one processor, wherein
A non-transitory computer-readable storage medium storing a
Dependencies are inferred from the claim text.