Euv pellicle with structured ventilation frame
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorYun-Yue LIN
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorYun-Yue LIN
Estimating the term…
A reticle structure includes a reticle having patterned features and a first border section enclosing the patterned features. The reticle structure includes a membrane having a middle section a second border section enclosing the middle section. The reticle structure includes a frame disposed between the membrane and the reticle to mount the membrane over the patterned features of the reticle. The frame creates an enclosure between the reticle and the membrane and encircles the patterned features of the reticle. The frame includes a plurality of holes and the plurality of holes produces a threshold percentage of opening in the frame to maintain an equalized pressure difference between the enclosure and outside the enclosure below a threshold pressure.
A lithography system, comprising:
A reticle structure, comprising:
A method, comprising:
Dependencies are inferred from the claim text.